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Entropy: A Primer on Conditioning Functions
This guide will walk you through definitions, anecdotes, and parallel visualizations to explain in plain terms what entropy is and how it can be used in cryptography.
5 Expert Tips for Multi-Chip Module Ruggedization
This guide will walk you through five expert tips for ruggedization of multi-chip cryptographic modules.
FIPS 140-2 Single-Chip Level 3 Physical Security
We simplify the breakdown of FIPS 140-2 Single-chip Level 3 requirements for physical security.
10 Easy Steps to Cryptographic Algorithm Validation
Industry leader in providing Federal Information Processing Standards (FIPS) validations.
Fundamentals of Digital Signatures
Explore how digital signatures are made, and how to establish trust in a cyber world.
Other eBooks and Guides
Fault Injection and
Environmental Failure Testing
Fault induction is a process by which a device (and for the purpose of this discussion, in particular a cryptographic module) is forced to miscalculate defined operations, skip over required operations (such as password verification or self-tests), and exhibit other erroneous behaviors enabling the attacker (or tester) to gain access to sensitive data or unauthorized control of the device.
On September 1, 2015, DCI provided to SMPTE a memorandum regarding its investigation into the implications of SP800-56Br1 compliance, should NIST decide to enforce it. In May 2016, NIST announced that it would enforce SP800-56Br1. This document is an update to DCI’s earlier FIPS memoranda regarding impact to Media Block (MB) designs and the Key Delivery Message (KDM).